Image degradation and information restoration in high-resolution in situ (S)TEM imaging

Abstract

Transmission electron microscopy (TEM) enables us to look beyond the resolution limit of optical microscopy, allowing the investigation of materials at the atomic scale and revealing the complex internal structures and mechanisms that underpin innovation. This capability sets the stage for groundbreaking applications, ranging from catalysts that support a greener economy to novel thin films for next-generation nano-electronics. To study materials under realistic gaseous and liquid reaction conditions, in situ cells are utilised. The ability to observe fundamental reactions and structural changes in real-time is essential for developing practical applications; however, introducing such environments into the high-vacuum of the TEM column inevitably presents limitations. The focus of this project is to quantify the degradation of image quality in situ and to evaluate the effectiveness of zero-loss peak energy-filtering in restoring structural information. Using a state-of-the-art Thermo Fisher Scientific Spectra 300 TEM, performance will be assessed across various imaging modalities.